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Journal Articles:

2012   |   2011   |   2010


Relative Quantum Yield Measurements of Coumarin Encapsulated in Core-Shell Silica Nanoparticles (Abstract)
Journal of Fluorescence, 2010, V20, N1 (Jan), P67-72
Herz E; Marchincin T; Connelly L; Bonner D; Burns A; Switalski S; Wiesner U
Modeling Disorder in the Crystal Structure of the alpha Polymorph of Alq(3) (Abstract)
Journal of Chemical Crystallography, 2010, V40, N3 (Mar), P195-200
Rajeswaran M; Blanton TN; Young RH; Brennessel W
Electronic Structure and Charge-Transport Properties of N,N '-Bis(cyclohexyl)naphthalene Diimide (Abstract)
Journal of Physical Chemistry C, 2010, V114, N6 (Feb 18), P 2751-2755
Adiga SP; Shukla D
The Role of Adhesion in Electrophotographic Digital Printing (Abstract)
Journal of Adhesion Science and Technology, 2010, V24, N3, P 583-617
Rimai DS; Brown K; Zaretsky MC; Lofftus K; Aslam M; Fowlkes WY; Weiss DS
Temporal analysis of power law liquid jets (Abstract)
Computers & Fluids, 2010, V39, N5 (May), P820-828
Gao ZJ; Ng K
Molecular Basis for Neurofilament Heavy Chain Side Arm Structure Modulation by Phosphorylation (Abstract)
Journal of Physical Chemistry C, 2010, V114, N12 (Apr 1), P 5410-5416
Adiga SP; Brenner DW
Inpainting quality assessment
Journal of Electronic Imaging, 2010, V19, N1 (Jan-Mar), Article Number: 011002
Ardis PA; Brown CM; Singhal A
Quantitative analysis for hillocks grown from electroplated Sn film
Journal of Applied Physics, 2010, V107, N7 (Apr 1), Article Number: 074902
Cheng J; Chen S; Vianco PT; Li JCM
Residual strain effects on a non-contact magnetoelastic torque transduce
International Journal of Applied Electromagnetics and Mechanics, 2010, V32, N3, P183-193
Andreescu R; Spellman B; Furlani EP